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KMID : 0385519900030010033
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Analytical Science & Technology
1990 Volume.3 No. 1 p.33 ~ p.41
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XRF and XRD Analysis of Chemical Ingredients in Dielectric Material(BaTiO₃)
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김영만/Kim, Young-Man
김선태/이경미/이종욱/김영상/Kim, Sun-Tae/Lee, Kyung-Mi/Lee, Chong-Wook/Kim, Young-Sang
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Abstract
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X-ray fluorescence spectrometry, Dielectric materi
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KEYWORD
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